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DIN EN 60747-5-3 VDE 0884-3:2003-01
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DIN EN 60747-5-3 VDE 0884-3:2003-01
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices; Measuring methods (IEC 60747-5-3:1997 + A1:2002); German version EN 60747-5-3:2001 + A1:2002More info
This part of IEC 60747 describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.
| Author | VDE |
|---|---|
| Editor | VDE |
| Document type | Standard |
| Format | Paper |
| ICS | 31.260 : Optoelectronics. Laser equipment
|
| Number of pages | 45 |
| Replace | DIN EN 60747-5-3 (2002-04) |
| Replaced by | DIN EN 60747-5-5 (2011-11, t) |
| Cross references | EN 60747-5-3 (2001-07), IDT |
| Weight(kg.) | 0.1765 |
| Year | 2003 |
| Document history | DIN EN 60747-5-3 (2003-01) |
| Country | Germany |
| Keyword | DIN EN 60747;DIN EN 60747-5;EN 60747;EN 60747-5;EN 60747-5-3;60747 |