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DIN EN 62228-2 VDE 0847-28-2:2017-09
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DIN EN 62228-2 VDE 0847-28-2:2017-09
Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers (IEC 62228-2:2016); German version EN 62228-2:2017More info
This document specifies test and measurement methods, test conditions, test setups, test procedures, failure criteria and test signals for the EMC evaluation of ICs with integrated LIN transceivers concerning disturbances on signal and voltage supply lines.
| Author | VDE |
|---|---|
| Editor | VDE |
| Document type | Standard |
| Format | Paper |
| ICS | 31.200 : Integrated circuits. Microelectronics
33.100.20 : Immunity |
| Number of pages | 48 |
| Replace | DIN EN 62228-2 (2015-02) |
| Cross references | EN 62228-2 (2017-02), IDT |
| Weight(kg.) | 0.1816 |
| Year | 2017 |
| Document history | DIN EN 62228-2 (2017-09) |
| Country | Germany |
| Keyword | DIN EN 62228;EN 62228;EN 62228-2;62228 |