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DIN EN IEC 60749-26 VDE 0884-749-26:2018-10
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DIN EN IEC 60749-26 VDE 0884-749-26:2018-10
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (IEC 60749-26:2018); German version EN IEC 60749-26:2018More info
This part of series DIN EN 60749 establishes the procedure for testing, evaluating, and classifying components and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD).
| Author | VDE |
|---|---|
| Editor | VDE |
| Document type | Standard |
| Format | Paper |
| ICS | 31.080.01 : Semiconductor devices in general
|
| Number of pages | 59 |
| Replace | DIN EN 60749-26 (2014-09) |
| Cross references | EN IEC 60749-26 (2018-03), IDT |
| Weight(kg.) | 0.2003 |
| Year | 2018 |
| Document history | DIN EN IEC 60749-26 (2018-10) |
| Country | Germany |
| Keyword | DIN EN IEC 60749;EN IEC 60749;EN IEC 60749-26;60749 |