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VDI/VDE 5575 Blatt 2:2015-06
New product
VDI/VDE 5575 Blatt 2:2015-06
X-ray optical systems - Measurement methods - Measurement set-up and methods for the evaluation of X-ray optical systemsMore info
The standard describes the measurement set-up and methods to evaluate X-ray optical systems. Methods to characterise geometric properties of X-rays are described as well as approaches for their spectral analysis. Coordinate systems for non-ambiguous description of the measurement set-up are defined. Positioning and detector systems suitable for the different measurement tasks are specified. An overview of common X-ray sources is given. The typical properties of the different X-ray sources relevant for their measurement are described.
| Author | VDI |
|---|---|
| Editor | VDI |
| Document type | Standard |
| Format | File |
| ICS | 17.180.30 : Optical measuring instruments
|
| Number of pages | 31 |
| Replace | VDI/VDE 5575 Blatt 2 (2013-12) |
| Year | 2015 |
| Document history | VDI/VDE 5575 Blatt 2 (2015-06) |
| Country | Germany |
| Keyword | VDI 5575;VDI 5575 Blatt 2;VDI/VDE 5575;5575 |