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The standard describes significant influences on the precision of measurements using radiation thermometers and explains their effects on a typical application. The procedure for choosing a suitable wavelength range for contact-free temperature measurements is described. The emissivity of important materials are summed up in a table. The influence of the object temperature, the dimension of the measurement field, and the setting time on the temperature resolution reachable are discussed.
Author | VDI |
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Editor | VDI |
Document type | Standard |
Format | File |
ICS | 17.200.20 : Temperature-measuring instruments
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Number of pages | 38 |
Replace | VDI/VDE 3511 Blatt 4.5 (2014-04) |
Year | 2015 |
Document history | VDI/VDE 3511 Blatt 4.5 (2015-06) |
Country | Germany |
Keyword | VDI 3511;VDI 3511 Blatt 4.5;VDI/VDE 3511;3511 |