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Reflection zone plates are spectral selective and have focussing and dispersive properties. They are used amongst others in X-ray microscopy and X-ray spectroscopy. The standard describes the physical principles of reflection zone plates for X-rays. Total external reflection zone plates and Bragg-Fresnel zone plates are introduced as the most important designs. The structure of reflection zone plates, typical parameters for characterisation and the dependencies between different properties are discussed. This standard defines important properties of reflection zone plates and thus facilitates communication between suppliers and users of these X-ray optics. Especially, this standard enables developers of X-ray optical systems to properly evaluate and specify reflection zone plates as element for X-ray microscopy and spectroscopy.
Author | VDI |
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Editor | VDI |
Document type | Standard |
Format | File |
ICS | 17.180.30 : Optical measuring instruments
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Number of pages | 8 |
Replace | VDI/VDE 5575 Blatt 6 (2011-12) |
Year | 2018 |
Document history | VDI/VDE 5575 Blatt 6 (2018-09) |
Country | Germany |
Keyword | VDI 5575;VDI 5575 Blatt 6;VDI/VDE 5575;5575 |