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VDI/VDE 5575 Blatt 1:2018-09
New product
VDI/VDE 5575 Blatt 1:2018-09
X-ray optical systems - Terms and definitionsMore info
This standard defines terms and quantities relevant for the description of optics for the spectral range below 100 nm. It enables the comparability of functional parameters for X-ray optics and is intended for users, developers and producers.
| Author | VDI |
|---|---|
| Editor | VDI |
| Document type | Standard |
| Format | File |
| ICS | 01.040.17 : Metrology and measurement. Physical phenomena (Vocabularies)
17.180.30 : Optical measuring instruments |
| Number of pages | 15 |
| Replace | VDI/VDE 5575 Blatt 1 (2009-11) |
| Year | 2018 |
| Document history | VDI/VDE 5575 Blatt 1 (2018-09) |
| Country | Germany |
| Keyword | VDI 5575;VDI 5575 Blatt 1;VDI/VDE 5575;5575 |