Cart
0
Product
Products
(empty)
No products
To be determined
Shipping
$0.00
Total
Product successfully added to your shopping cart
Quantity
Total
There are 0 items in your cart.
There is 1 item in your cart.
Total products
Total shipping
To be determined
Total
Reduced price!
View larger
View larger
19/30351707 DC
New product
19/30351707 DC
BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR methodMore info
| Author | BSI |
|---|---|
| Editor | BSI |
| Document type | Draft |
| Format | File |
| ICS | 71.040.40 : Chemical analysis
|
| Number of pages | 25 |
| Cross references | ISO/DIS 21222 |
| Year | 2019 |
| Country | United Kingdom |