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BS IEC 62951-1:2017

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BS IEC 62951-1:2017

Semiconductor devices. Flexible and stretchable semiconductor devices - Bending test method for conductive thin films on flexible substrates

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Author BSI
Editor BSI
Document type Standard
Format File
EAN ISBN 978 0 580 89312 4
ICS 31.080.99 : Other semiconductor devices
Number of pages 18
Cross references IEC 62951-1:2017
Year 2018
Country United Kingdom